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Analysis: Structural

High Resolution X-Ray Diffractometer System

33. HIGH RESOLUTION X RAY DIFFRACTOMETER SYSTEMModel PANalytical X’Pert PRO MRD PW3040

General Descriptions:

The modular system approach of the X’Pert PRO system provides full flexibility to in-depth research investigations, from routine characterization of minerals to exploration of the most complex high-technology materials.

System Features:

This modular design of X’Pert PRO utilizing the Pre FIX concept makes it possible to perform more than one type of analysis on one system.

Pre FIX enables the user to re-configure the system from one application setup to another within a few minutes without the need for additional system alignment.

Applications:

Phase analysis of samples with flat or irregular surfaces of thin films.

Stress analysis.

Reflectometry on thin layers and substrate materials.

High resolution rocking curve analysis and reciprocal space mapping.

Texture analysis on all kinds of materials with a preferred orientation of The crystallites.

Analysis of perfect and lattice mismatched epitaxial layers, Heterostructures, multilayer and thin layers

Software to perform ternary composition analysis.

Applications:

Thin film semiconductor

Pressed Pellets/powder

Z movement less than 11mm

Diameter size of less than 13 cm

Detection Limit/range: 300 – 1500 No limit

Thickness: Less than 11mm.

Elements: Only from the Periodic Table.

Library In Use: International Centre for Diffraction Data (ICDD)

Data for the identification of crystalline materials.

Reference: Manual book for High Resolution X-Ray Diffractometer System; Model: Panalytical X’pert Pro MRD PW3040

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