Model T3Ster 2000100 release 3, version Win32

General Descriptions:

Thermal transient tester (T3ster) is a product by Mentor Graphics which was launched in 1997. It is an equipment which directly measures the actual heating or cooling curves of the packaged semiconductor devices. Compared to conventional methods, T3ster provides a much sophisticated measurement method resulting a reliable measurement data. Performs all critical measurements of LED components including optical power, color and goniometric measurements.

Technical Specification:

   Temperature measurement accuracy: ± 0.01°C

   Resolution: 1 micro-second

   Controlled voltage source: U = ± 10.24V, LSB = 5 Mv

   Controlled current source: I = ± 2A, LSB = 1 mA

   Max. switched power: 50V, 2A

   Measurement channel

   No. of measurement channel: 2 – 8

   Resolution: 12 bit

   Noise: ± 1 bit

Attachments:

   Additional measurement channel

   Thermostat

   Power booster

   Still-air chamber

Applications:

   Heat-flow path reconstruction

   Die attach qualification

   Testing of stacked die packages

   Characterization of power LEDs

   Material property identification

   Thermal model verification

   In-situ, non-destructive failure analysis

   Reliability testing with power cycling and subsequent structure function analysis

   Thermal testing of parts in application environment, in live systems

General Descriptions:

Keithley's SourceMeter family is designed specifically for test applications that demand tightly coupled sourcing and measurement. All SourceMeter models provide precision voltage and current sourcing as well as measurement capabilities. Each SourceMeter instrument is both a highly stable DC power source and a true instrument-grade 51/2-digit multimeter. The power source characteristics include low noise, precision, and readback. The multimeter capabilities include high repeatability and low noise.

The result is a compact, single-channel, DC parametric tester. In operation, these instruments can act as a voltage source, a current source, a voltage meter, a current meter, and an ohmmeter. Manufacturers of components and modules for the communications, semiconductor, computer, automotive, and medical industries will find the SourceMeter instruments invaluable for a wide range of characterization and production test applications.

The Model 2400 SourceMeter solution is a 20W instrument that allows sourcing and measuring voltage from ±5µV (sourcing) and ±1µV (measuring) to ±200V DC and current from ±10pA to ±1A. It's well-suited for testing a wide range of devices, including diodes, resistors, resistor networks, active circuit protection devices, and portable battery-powered devices and components. It's also useful for systems power sourcing and IDDQ testing applications.

Key Features and Specification:

   New class of instruments designed for high speed DC testing

   Family of products offers wide dynamic range: 10pA to 10A, 1µV to 1100V, 20W to 1000W

   4-quadrant operation

   .0.012% basic accuracy with 5 1/2-digit resolution

   6-wire O measurement with programmable I source and V clamp

   1700 readings/second at 4 1/2 digits via GPIB

   Built-in comparator for fast pass/fail testing

   Optional contact check function

   Digital I/O for fast binning and connection to component handlers

   GPIB, RS-232, and Trigger Link interfaces

   TestPoint™ and LabVIEW™ drivers

System Capabilities:

   Tester uses Keithley 2400 with GPIB interface to desktop PC.

   IV curve measurement for solar cell (force V measure I).

   Customized analysis capabilities for PV cell:

   Voc, Isc, Vmax, Imax and Pmax

   Fill Factor, Series and Shunt Resistor

   Plots out I vs V and P vs V curve

Software Features:

   Print out results in raw data (once click export to Excel) and graph form

   Graphs appending and freezing

   Easy renaming of IV curve names

   Save and re-load plots (for standard curve checking)

   Logging of plot histories up to 40 plots

   2-wire/4-wire measurement

Reference: Leios IV Solar CT, Quick Start Guide Rev 7 (http://www.metrictest.com/catalog/brands/keithley/kei_2400.jsp)

Model Changmin Tech CMT-SR2000N

General Descriptions:

The CMT-Sr2000N is a fully automatic system used to measure sheet resistance and resistivity of silicon wafers. This system can be operated by itself. Furthermore the perfect remote control is available. Using a PC and its exclusive software it is able to give various data analysis.

System Features:

   X – Y – Z axis on full automatic sys.

   Auto & Manual range selection.

   Systems for 8” wafer.

   Perfect remote control by operating software.

   Data analysis. (2D, 3D map, Data Map, etc)

   ASTM & SEMI quick measurement mode.

Spesification:

   Sheet Resistance Measurement

   Measuring method : Contact by 4-point probe.

   Measuring range : 1 mOhm/sq ~ 2 mOhm/sq

   Resistivity Measurement

   Measuring method : Contact by 4-point probe. (Input thickness)

   Measuring range : 10.0 µohm.cm ~ 200.0 Kohm.cmCurrent Source : -10nA to 100mA

   DVM 0V to 2,000mV

   Accuracy: 0.2% (KRISS Circuits).

   Measurement Accuracy: - ± 0.5% (VLSI Standard Wafer At 230C)

   Four-Point Probe (JANDEL ENG)

   Pin Spacing : 25 ~ 50 mils by 5 mil increments.

   Pin Load : 10 ~ 250 gram/pin

   Pin Radius : ± 0.01 mm

   Needles : Solid tungsten carbide Ø 0.40 mm

   Measurement Modes: Auto, Quick, Point & Manual measurements

   Specimen : Wafer max 8”

   Measuring Time : Approx. 3 ± 1sec/point.

Reference: Manual book for Sheet Resistance/Resistivity; Model: Changmin Tech CMT-SR2000N

Model CSS 500 N2

General description:

Various current surge pulses are specified to determine the characteristics of a protection device such as a varistor.The CSS 500N2 is a dedicated equipment to test small size protection devices such as SMD components requiring testcurrents of several tenth to a few hundred amperes.

EM TEST is offering solutions for small energy varistors with test currents up to 1,200A as well as generators to that range up to 10, 15 or 25kA.

Specification:

   Wave shape 8US/20US

   Charging voltage : Max. 2'500V

   Output current (short circuit) : Max. 1'200A +10%/-10%

   Pulse front time : 8us +20%/-20%

   Pulse time to half value : 20us +20%/-20%

   Undershoot : Max. 20%

       Range I :1 to 18A

       Range II : 6 to 140A

       Range III : 40 to 1'200A

   Polarity : Positive/negative/alternating

   Counter : 1 to 30'000 or endless

   Trigger

       Automatic : Automatic pulse release

       Manual : Single pulse release

   External : External pulse release

   CRO trigger : 5V trigger signal for oscilloscope

   Repetition rate : 1s to 100s

MEASUREMENTS

   CRO I-monitor:

       Range I : 1V/A

       Range II : 100mV/A

       Range III : 10mV/A

   CRO V monitor:

     100mV/V only for measuring residual voltages up to 500V on VDR's

       Peak current : 1'200A in the LCD display

       Peak voltage : 2'500V in the LCD display

GENERAL DATA:

   Dimensions, weight : 19"/6HU, approx. 25kg

   Supply voltage : 115V/230V +10/-15%

   Fuses : 2 x T 1AT (230V) or 2 x T 2AT (115V)

Reference: Manual Book for Memtest CSS 500N2 current surge generator

Keithley Model 82

General Descriptions:

The Model 82 Simultaneous C-V system makes simultaneous Quasistatic and High Frequency measurements, reducing the measurement time and inaccuracies without changing connections to the device under test. It corrects for system leakages and cabling effects, finds oxide capacitance and equilibrium sweep rate, analyses data and plots output graph. The 238 High-Current Source Measure Unit is ideally suited for measuring the electrical characteristics of devices. Sweep parameters are stored in non-volatile memory making repetitive measurements easy, such as the comparison of static and energized I-V characteristics of devices.

Specification:

   Current measurements ranging from 10fA to 1A

   Reading Rates: 4½ readings per sec to one reading every 400 sec

   Data Buffer: 1000 points max

   Maximum Input: 30V peak, DC to 60Hz sine wave

   Voltage Source: 1uV to 1100V

   High Frequency Capacitance:

       100 kHz:

           Range 200pF – Res 10 fF

           Range 2nF – Res 100fF

       1Mhz :

           Range 200pF-Res 10fF

           Range 2nF-Res 100fF

       Quasistatic Capacitance:

           Range 200pF – Res 10fF

           Range 2nF – Res 100fF

Specification:

Basic Simultaneous Capacitance-Voltage measurements

Bias-Temperature Stress (BTS) and Triangular Voltage Sweep (TVS) methods for determining oxide charges

Series resistance measurements and compensation foe effects

Interface trap density plots for the band gap.

Reference: Manual Book for CV-IV Measurement System Keithley; Model: 82

Model LAKESHORE CONTROLLER 601DRC-93CA

General Descriptions:

HL5500PC is a turnkey, high performance Hall System for the measurement of resistivity, carrier concentration, and mobility in semiconductors. Modular in concept, allowing easy upgrade paths, the system is suitable for a wide variety of materials, including silicon and compound semiconductors. HL5500PC has both low and high resistivity measurement capabilities, with optional cryostats extending the temperature range from below 4K to as high as 600º C. With an intuitive Microsoft Windows user interface, no programming experience is required to set up or use the HL5500PC.

System features:

AC/DC measurement modes. The use of AC currents and phase sensitive detection eliminates thermal effects, long term drifts and significantly enhances signal-to-noise ratios. DC mode is useful when rate dependent trapping, rectification due to non-ohmic contacts or stray capacitance may affect AC currents

Van der Pauw measurements to ASTM F-76 standard.

Simple probe system for convenient and fast sample throughput.

Compact bench top design.

Wide current range including auto-current facility in order to minimize sample heating.

User defined electric field limitation to avoid impact ionization effects at low temperatures.

Software control of all measurement functions, data reduction and storage, text and graphical output to printer.

Optional variable temperature capabilities.

Two-point, room temperature and 77K.

Rare earth permanent magnet giving excellent stability.

Light-tight sample enclosure avoiding measurement errors due to photo generated effects.

Probe system allowing rapid sample set-up for room temperature and 77K assessment of wafers up to three inch diameter.

Extensive verification of measurement validity including contact checking algorithms.

Electro-forming circuitry for contact formation.

Wide dynamic range of sheet resistivity of 0.1 m ohm/sq. to levels in excess of 1 M ohm/sq.

Up to three inches specimen in diameter.

Specifications:

Suitable for a wide variety of materials: InP, GaAs, GaN, SiC, SiGe, Si, etc.

With HL5580PC High Resistivity Buffer/Source Module Current Source 1pA-10uA.

The system has configuration suitable for sheet resistivity of about 0.1m ohm/sq. to levels in excess of 1M ohm/sq. and current source range of 10nA~20mA.

Accent offer a High Resistivity Buffer Amplifier (HL5580PC) to extend sheet resistivity measurement capability to about 100 G ohm/sq. with source current 1 pA.

The system has magnet strength of 0.32T with individually calibrated item – 0.32T ± 1% of marked value.

Reference: Manual book for Hall Effect Measurement System; Model: Accent / Hl 5500 Pc