EQUIPMENT

The Bruker D8 DISCOVER features with DAVINCI design is an ease of use XRD system with plug-and-play functionality and real-time component detection. Plug-and-play concept allows real-time component detection. functionally and fully integrated XRD system. These unique features allow the user to easily switch between the X-ray diffraction applications, including qualitative and quantitative phase analysis, structure analysis, reflectometry, high-resolution X-ray diffraction, reciprocal space mapping, grazing incidence diffraction (in-plane GID), etc.

MPI Corporation Probe Stations with Micro Positioner are versatile and flexible research platforms that can be used in dedicated applications. MPI TS150 probe system also is an effective and highly accurate manual probe system designed for precise analytical probing of substrates with diameter up to 150 mm. It also designated to support a wide variety of applications and enable physical scientists and researchers to conduct fundamental research through convenient and repeatable measurements producing consistent results.

The quick test measurement can be taken with various electronic test equipment, including a custom probe station with Optika microscope, Newport linear stage and MPI micropositioner, Keithley parameter analyzer for synchronizing current-voltage (I-V), capacitance-voltage (C-V) and ultra-fast pulsed I-V measurements, Newport power meter for optical power and energy near-monochromatic or monochromatic sources measurements and Ocean Insight spectrometer for UV-Visible (200-850 nm) measurements.

Electroluminescence is a phenomenon of certain materials such as semiconductors that causes the material to emit light due to the passage of an electric current. Electroluminescence leads a direct conversion of electric energy to light. The Avasphere integrating sphere has a diameter of 108 mm and a SMA port at 90 degrees for both irradiance and reflection measurements. The reflection sphere has an additional SMA-connector port at 8 degrees.

Photon System Deep UV (DUV) Mini PL/RAMAN Spectrometer provides the most compact and  inexpensive instrument with deep UV (224 nm) excitation light source. This system allows the PL measurements of semiconductor materials with bandgap up to about 5.5 eV corresponding to AlGaN with Al concentrations up over 80%.

The Model 2450 is Keithley’s next-generation source measure unit (SMU) that truly brings Ohm’s law (current, voltage, and resistance) testing right to your fingertips. Its innovative graphical user interface (GUI) and advanced, capacitive touchscreen technology allow intuitive usage and minimize the learning curve to enable engineers and scientists to learn faster, work smarter, and invent easier.

The Newport 1936-R, RoHS compliant Single Channel High Performance Optical Power and Energy Meter is one of the most sophisticated optical meters available in the market. These instruments combine the superb femtowatt level sensitivity reached by the 1931-C and the extreme versatility of 1935-C, resulting in a truly revolutionized instrument. All compatible detectors will work with the instrument.

Vacuum pump for removing trapped gases from compounds. With the appropriate vacuum pump, the degas chamber is used to reduce the pressure above the surface of the material and permit escape and subsequent removal of entrapped air and other gases that could induce failure of the final product.

The BP-125 from Microwave Research and Applications, Inc. is an economical and compact laboratory microwave ideal for tissue staining, antigen retrieval, chemical processing, sample ashing, and other general laboratory heating tasks. The user can program the process controller for a temperature profile for the sample. The process controller then monitors the sample temperature and will increase the temperature of the sample at the programmed rate and then hold the sample at a desired temperature for any length of time.

UPRtek MK350N Plus Handheld Spectrometer is a Spectrum Analyzer, LED Meter and Flicker Meter for LED measurement. It includes more than 40 light measurement units such as CCT, CRI, CIE1931/1976, LUX, TLCI and others.

The Hall Effect Measurement System Model DX-50 is a precision instrument designed for accurate electrical characterization of semiconductor and functional materials. It enables reliable measurement of key parameters, including carrier concentration, mobility, Hall coefficient, and resistivity, making it suitable for research and quality control applications.

The system features a stable magnetic field source to ensure consistent Hall voltage generation, paired with high-sensitivity, low-noise electronics for precise signal detection. Supporting the widely used van der Pauw method and standard four-point probe configuration, the DX-50 offers flexibility in sample measurement while minimizing contact resistance effects.

Its compact design and user-friendly software interface allow easy operation, real-time monitoring, and automatic data analysis. The system operates under ambient, fixed temperature conditions, providing a simplified and stable measurement environment.

With strong repeatability and dependable performance, the DX-50 is an efficient solution for routine electrical characterization in modern laboratories.

The ezHEMS is an integrated system designed for precise measurement of electrical properties including resistivity, Hall coefficient, carrier concentration, and mobility. It supports both 4-contact Van der Pauw and 6-contact Hall Bar configurations without hardware changes.

Operating within a temperature range of 80 K to 770 K and magnetic field up to 8000 G, the system enables advanced material characterization such as I–V, R–T, and magneto-resistance measurements. Powered by LabVIEW-based software, ezHEMS offers fully automated operation, real-time data visualization, and efficient data processing.

It is widely used in semiconductor research, thin film studies, and quality control applications, supporting materials such as Si, GaN, SiC, and other advanced compounds.